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现在位置首页>物性测试仪器>物理光学仪器>物理光学仪器>NanoCalc 反射膜厚测量系统
NanoCalc 反射膜厚测量系统
NanoCalc 反射膜厚测量系统
  • NanoCalc 反射膜厚测量系统

NanoCalc 反射膜厚测量系统

产品报价:询价

更新时间:2012/6/1 11:29:29

地:上海

牌:海洋光学

号:NanoCalc

厂商性质: 生产型,贸易型,

公司名称: 上海玻色智能科技有限公司

产品关键词:

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薛先生   13817727148  xuekq@bosontech.com.cn

http://www.bosontech.com.cn/Products/nanocalc.html

薄膜的光学特性主要有反射和干涉。NanoCalc薄膜反射测量系统可以用来进行10nm -250um的膜厚分析测量,对单层膜的分辨率为0.1nm。根据测量软件的不同,在1秒钟内可以分析单层或最多达到10层的膜厚。




产品特点
可分析单层或多层薄膜;
分辨率达0.1nm;
适合于在线监测;

使用原理

最常用的两种测量薄膜的特性的方法为光学反射和投射测量、椭圆光度法测量。NanoCalc利用反射原理,通过测量宽光谱范围内的反射率曲线来进行膜厚测量。
查找n和k值

可以进行多达十层的薄膜测量,薄膜和基体材质可以是金属、电介质、无定形材料或硅晶等。NanoCalc软件包含了大多数材料的n和k值数据库,用户也可以自己添加和编辑。




应用

NanoCalc薄膜反射材料系统适合于在线膜厚测量,包括氧化层、中氮化硅薄膜、感光胶片及其它类型的薄膜。NanoCalc也可测量在钢、铝、铜、陶瓷、塑料等物质上的抗反射涂层、抗磨涂层等。
NanoCalc Systems Available
NANOCALC-2000-UV-VIS-NIR

Wavelength:
250-1100 nm

Thickness:
10 nm-70 um

Light source:
Deuterium and Tungsten Halogen


NANOCALC-2000-UV-VIS

Wavelength:
250-850 nm

Thickness:
10 nm-20 um

Light source:
Deuterium and Tungsten Halogen


NANOCALC-2000-VIS-NIR

Wavelength:
400-1100 nm

Thickness:
20 nm-10 um (optional 1 um-250 um)

Light source:
Tungsten Halogen


NANOCALC-2000-VIS

Wavelength:
400-850 nm

Thickness:
50 nm-20 um

Light source:
Tungsten Halogen


NANOCALC-2000-NIR

Wavelength:
650-1100 nm

Thickness:
70 nm-70 um

Light source:
Tungsten Halogen


NANOCALC-2000-NIR-HR

Wavelength:
650-1100 nm

Thickness:
70 nm-70 um

Light source:
Tungsten Halogen


NANOCALC-2000-512-NIR

Wavelength:
900-1700 nm

Thickness:
50 nm-200 um

Light source:
High-power Tungsten Halogen

For Reflectometry applications, the following items are required:
NC-2UV-VIS100-2
Bifurcated UV fiber
400 um x 2m
2x SMA connectors
Flexible metal jacketing

NC-STATE
Single point reflection measurement for non transparent samples
Step-Wafer 5 Steps 0-500 mm, calibrated 4"

If using a microscope, the following items are also needed:
NC-7UV-VIS200-2
Reflection probe for application microscopy with MFA-C-Mount
Step-Wafer 5 Steps 0-500 mm, calibrated 4"

NanoCalc Specifications
Angle of incidence:
90°

Number of layers:
3 or fewer

Reference measurement needed:
Yes (bare substrate)

Transparent materials:
Yes

Transmission mode:
Yes

Rough materials:
Yes

Measurement speed:
100 milliseconds to 1 second

On-line possibilities:
Yes

Mechanical tolerance (height):
With new reference or collimation (74-UV)

Mechanical tolerance (angle):
Yes, with new reference

Microspot option:
Yes, with microscope

Vision option:
Yes, with microscope

Mapping option:
6" and 12" XYZ mapping tables

Vacuum possibilities:
Yes