NSOM Probes,近场光学显微镜,AFM Probes,原子力探针,Glass Insulated AFM Controlled Nanowires

NSOM Probes

产品报价：询价

更新时间：2023/4/3 18:11:18

产地：其他国家

品牌：nanonics

型号：SPM Probes and Nanot

厂商性质：生产型,

公司名称：世联博研（北京）科技有限公司

产品关键词：

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王荣 : (18618101725) (18618101725)

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Optical Fiber AFM Probes
Glass probes for imaging surface topography with nanometric resolution and better characteristics than silicon atomic force sensors.

Lens Fiber Probes

Hard to Achieve Force Constants and Resonance Frequencies

Deep Trench Probes

Electrical Probes
Gold-coated Nanonics glass AFM fiber tips

NanoFountainpens™ for Gas or Chemical Delivery
Opening up SPM to nanochemistry with controlled chemical delivery to or removal from regions as small as 20 nanometers.

		Fiber Probe - Optical Fiber NSOM Probes Ground breaking probes performing all current modes of NSOM operation and other exciting new techniques.				Apertureless NSOM Probes Raman Enhancement and Shadow NSOM with metal coated optical fiber probes, nanopipettes with embedded nanoparticles and tips with roughened edges.

		Active NSOM Probes				Hollow NSOM Imaging Probes Polished nanopipettes for high peak power laser pulses and use in the IR and very deep UV regions.

		Single Wire Nanopipette Probes A variety of glass insulated nanowires opening up new worlds of SPM research.				Electrochemical and SECM Probes Consisting of a tapered metal wire running through a glass nanopipette

		Coaxial Probes / Shielded STM Probes Consisting of a tapered metal wire running through a metal-coated glass nanopipette.				Thermocouple Probes Localized thermal measurements by a voltage dependent metallic junction created at the tip of a metal coated glass insulated nanowire.

		Double-Wire Electrodes Two nanowires tapered inside a dual channel nanopipette and kept electrically isolated for localized electrical measurements correlated with surface topography.				Nanotweezers™ Two tapered platinum nanowires flexing together upon action of a controlled voltage.

		Double-Wire Thermoresistive Probes The only thermoconductivity probes that provide AFM intermittent contact imaging of surfaces.

| 第14年

手机：18618101725

联系人：王荣

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