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现在位置首页>通用分析仪器>显微镜>电子显微镜(扫描电镜、透射电镜)> 丹麦Image Metrology扫描探针显微镜图像分析系统SPIP

商品编号:51582
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丹麦Image Metrology扫描探针显微镜图像分析系统SPIP

价    格:询价

产    地:其他国家更新时间:2019/7/15 13:41:34

品    牌:Image Metrology型    号:SPIP

状    态:正常点击量:1977

18253171090
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济南欧莱博科学仪器有限公司

联 系 人:李经理

电     话:18253171090

传     真:

等     级: (第 4年)

性     质:生产型,

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OEM Distributors
The following OEM Distributors offer SPIP™ together with new instruments:

A.P.E. Research s.r.l.

ADE Phase Shift

Ambios Technology, Inc.

ATOS GmbH

Danish Micro Engineering A/S

JEOL

L.O.T.-Oriel GmbH & Co. KG

Molecular Imaging

NanoInk, Inc.

NanoMc

Nanonis GmbH

Omicron NanoTechnology GmbH

Omniscan

PSIA Corporation

SII NanoTechnology, Inc.

STIL SA

Surface Imaging Systems (S.I.S.)

Thermo Electron (Karlsruhe) GmbH
 

Over the years, the Scanning Probe Image Processor, SPIP™, has become the de-facto standard for image processing at nanoscale.

SPIP™ is a modular software package offered as a basic module and 14 optional add-ons dedicated to specific purposes.

Whether you are an expert user or new to the field of image analysis, SPIP™ lets you produce the results you need with just a few mouse clicks.

SPIP™ is used for various purposes including Semiconductor Inspection, Physics, Chemistry, Biology, Metrology, and Nano Technology.

SPIP™ currently supports 60 file formats.

The current SPIP™ version is 4.1.6, released 2005-12-13. 



产品介绍

Company History
Image Metrology was founded in 1998. Today we are a world wide leading supplier of image processing software for "nano-microscopy".
Our mission is to provide our customers with state-of-the-art image processing software for microscopy including:
Correction tools for creating the most accurate presentation of the "true" surface Automated analysis techniques assuring high accuracy, quality and cost efficiency Visualization and reporting tools enabling convincing and impressive communication of results This mission is fulfilled by development of our main product the Scanning Probe Image Processor, SPIP™. SPIP™ supports a wide variety of microscope types and their file formats including Scanning Probe Microscopes (SPM), interference microscopes, Scanning Electron Microscopes (SEM), confocal microscopes and profilers.
Image Metrology is a highly innovative company constantly developing new solutions meeting the demands from our high-tech customers. Image Metrology is supplying its products directly to the end users or via our distribution network, and having an export rate of 98%.



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